The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 25, 2023

Filed:

Aug. 04, 2022
Applicant:

Zhejiang University, Zhejiang, CN;

Inventors:

Yong He, Hangzhou, CN;

Xiaoyue Du, Hangzhou, CN;

Assignee:

Zhejiang University, Zhejiang, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06T 3/40 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0002 (2013.01); G06T 3/4038 (2013.01); G06T 2207/10032 (2013.01); G06T 2207/30168 (2013.01);
Abstract

The present disclosure provides a stitching quality evaluation method and system, and a redundancy reduction method and system for low-altitude UAV remote sensing images, and belongs to the technical field of image processing. The method comprises: firstly acquiring ground images using a UAV under a preset overlap degree to obtain a low-altitude UAV remote sensing image set, then stitching the low-altitude UAV remote sensing image set to obtain a stitched image, and finally performing a quality evaluation on the stitched image using an improved BRISQUE algorithm to obtain an image quality score, which is applicable to quality evaluation of visible images and multispectral images at the same time through the improved BRISQUE algorithm. In addition, the present disclosure further provides an image redundancy reduction method based on the improved BRISQUE algorithm, thereby improving the image stitching efficiency and stitching quality.


Find Patent Forward Citations

Loading…