The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 25, 2023

Filed:

Aug. 10, 2020
Applicant:

Pc-tel, Inc., Bloomingdale, IL (US);

Inventors:

Sumeet Singh Paul, Evanston, IL (US);

Stephen V. Saliga, Akron, OH (US);

Assignee:

PCTEL, INC., Bloomingdale, IL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06Q 30/018 (2023.01); H04B 17/391 (2015.01); H04W 4/33 (2018.01); G01C 21/20 (2006.01); G06Q 10/04 (2023.01); G06F 16/29 (2019.01); G06N 5/04 (2023.01); G06Q 50/26 (2012.01);
U.S. Cl.
CPC ...
G06Q 30/018 (2013.01); G01C 21/206 (2013.01); G06F 16/29 (2019.01); G06N 5/04 (2013.01); G06Q 10/04 (2013.01); G06Q 50/26 (2013.01); H04B 17/3913 (2015.01); H04W 4/33 (2018.02);
Abstract

Systems and methods for selecting a worst service first optimized test path are provided. Such systems and methods can include using previously collected RF results that are relevant to a target building to calculate predictive RF results for a plurality of test points in the target building, using the predictive RF results to calculate the optimized test path through the target building, measuring a respective actual RF signal value of each of the plurality of test points in succession along the optimized test path, counting failing ones of the plurality of test points, and stopping measurements of the respective actual RF signal value of each of the plurality test points when a counted number of the failing ones of the plurality of test points exceeds a failure threshold value.


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