The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 25, 2023

Filed:

May. 18, 2020
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventors:

Mayumi Suzuki, Tokyo, JP;

Yasuho Yamashita, Tokyo, JP;

Takuma Shibahara, Tokyo, JP;

Assignee:

HITACHI, LTD., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A63F 9/24 (2006.01); A63F 11/00 (2006.01); G06F 13/00 (2006.01); G06F 17/00 (2019.01); G06N 5/04 (2023.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06N 5/04 (2013.01); G06N 20/00 (2019.01);
Abstract

A data analysis apparatus executes: a selection process selecting a first feature variable group that is a trivial feature variable group contributing to prediction and a second feature data group other than the first feature variable group from a set of feature variables; an operation process operating a first regularization coefficient related to a first weight parameter group corresponding to the first feature variable group in a manner that the loss function is larger, and operating a second regularization coefficient related to a second weight parameter group corresponding to the second feature variable group in a manner that the loss function is smaller, among a set of weight parameters configuring a prediction model, in a loss function related to a difference between a prediction result output in a case of inputting the set of feature variables to the prediction model and ground truth data corresponding to the feature variables.


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