The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 25, 2023

Filed:

Jul. 28, 2021
Applicant:

X Development Llc, Mountain View, CA (US);

Inventors:

Brian Adolf, San Mateo, CA (US);

Martin Schubert, Mountain View, CA (US);

Jesse Lu, Hollister, CA (US);

Assignee:

X Development LLC, Mountain View, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 30/20 (2020.01); G06F 30/17 (2020.01); G06T 17/00 (2006.01);
U.S. Cl.
CPC ...
G06F 30/20 (2020.01); G06F 30/17 (2020.01); G06T 17/00 (2013.01);
Abstract

A system, apparatus, and method for optimizing structural parameters of a physical device are described. The method includes receiving an initial description of the physical device describing the structural parameters within a simulated environment. The method further includes performing a simulation of the physical device in response to an excitation source to determine a performance metric of the physical device. The simulation environment includes one or more absorbing boundaries for attenuation of an output of the excitation source during the simulation. The method further includes recording attenuated field values of the simulated environment associated with the attenuation during the simulation. The method further includes determining a loss metric based on a difference between the performance metric and a target performance metric, backpropagating the loss metric using the attenuated field values, and generating a revised description of the physical device by updating the structural parameters to reduce the loss metric.


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