The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 25, 2023

Filed:

Nov. 05, 2020
Applicant:

Jpmorgan Chase Bank, N.a., New York, NY (US);

Inventors:

Alla Nadein, Englewood Cliffs, NJ (US);

Dheeraj Kumar, Bangalore, IN;

Saithulasiram Ramachandruni, Bangalore, IN;

Assignee:

JPMORGAN CHASE BANK, N.A., New York, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/36 (2006.01); G06F 11/07 (2006.01); G06F 11/30 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3684 (2013.01); G06F 11/076 (2013.01); G06F 11/3075 (2013.01); G06F 11/3688 (2013.01); G06F 11/3692 (2013.01);
Abstract

Various methods, apparatuses/systems, and media for automatic risk-based testing of an application are disclosed. A processor accesses a database to obtain data corresponding to a plurality of test results of test runs conducted over a certain period of time for a set of plurality of tests and data corresponding to a change set; generates historical data based on the data corresponding to the plurality of test results and the change set; assigns a test failing probability value for each test among the set of plurality of tests based on analyzing the historical data; identities a first test whose assigned test failing probability value is below a predetermined threshold value; and filters out the identified first test from the set of plurality of tests whose assigned test failing probability value is below the predetermined threshold value so that the identified first test is not utilized for future test runs.


Find Patent Forward Citations

Nadein, Alla. (2023). System and method for risk-based testing (U.S. Patent No. 11636024). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11636024

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…