The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 25, 2023
Filed:
Dec. 08, 2021
Emc Ip Holding Company Llc, Hopkinton, MA (US);
Jiacheng Ni, Shanghai, CN;
Min Gong, Shanghai, CN;
GuangZhou Zhou, Shanghai, CN;
Zijia Wang, WeiFang, CN;
Zhen Jia, Shanghai, CN;
EMC IP Holding Company LLC, Hopkinton, MA (US);
Abstract
Embodiments of the present disclosure include a method, an electronic device, and a computer program product for training a failure analysis model. In a method for training a failure analysis model in an illustrative embodiment, at least one set of log files including multiple preprocessed log files is obtained, the at least one set of log files including a marked failure cause of a storage system, and preprocessed log files in the multiple preprocessed log files including one or more potential failure causes of the storage system and scores associated with the potential failure causes; a failure cause of the storage system is predicted according to a failure analysis model and based on the potential failure causes and the scores in the multiple preprocessed log files; and parameters of the failure analysis model are updated based on a probability that the predicted failure cause is the marked failure cause.