The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 25, 2023
Filed:
Oct. 11, 2019
Leica Microsystems Cms Gmbh, Wetzlar, DE;
LEICA MICROSYSTEMS CMS GMBH, Wetzlar, DE;
Abstract
A method is useable for determining a refractive index of an optical medium in a microscope, which has an objective facing toward a sample chamber. The optical medium is one of two optical media, which border two opposing surfaces of a cover slip or object carrier in the sample chamber and form two partially reflective interfaces, which are arranged at different distances from the objective. The method includes: deflecting a measurement light beam by the objective with oblique incidence on the cover slip or object carrier; generating two reflection light beams spatially separated from one another by the measurement light beam being partially reflected at each of the interfaces; receiving the two reflection light beams by the objective and conducting them onto a position-sensitive detector; registering intensities by the position-sensitive detector; and determining the refractive index of the optical medium based on the registered intensities.