The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 25, 2023
Filed:
May. 18, 2021
Northwestern University, Evanston, IL (US);
Northwestern University, Evanston, IL (US);
Abstract
A method of microscopy comprises collecting an emission light; symmetrically dispersing the collected emission light into a first order ('1') light and a negative first order ('−1') light using a grating; wherein the 1light comprises spectral information and the −1light comprises spectral information; capturing the 1light and the −1light using a camera, localizing the one or more light-emitting materials using localization information determined from both the first spectral image and the second spectral image; and determining spectral information from the one or more light-emitting materials using the first spectral image and/or the second spectral image; wherein the steps of localizing and obtaining are performed simultaneously. A spectrometer for a microscope comprises a dual-wedge prism (“DWP”) for receiving and spectrally dispersing a light beam, wherein the DWP comprises a first dispersive optical device and a second dispersive optical device adhered to each other.