The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 25, 2023
Filed:
Jan. 23, 2020
Nippon Steel Corporation, Tokyo, JP;
Shinichi Oshima, Tokyo, JP;
Yoshito Isei, Tokyo, JP;
NIPPON STEEL CORPORATION, Tokyo, JP;
Abstract
The present invention provides a measuring apparatus and a measuring method in which a relative moving velocity of a target to be measured or a separation displacement of the target to be measured can be accurately measured even in a case where the target to be measured is moved. In a measuring apparatus, a relative moving velocity of a target to be measured and a separation displacement of the target to be measured can be measured in consideration of the influence of Doppler shift that occurs due to the movement of the target to be measured in an in-plane direction, and thus, even in a case where the target to be measured is moved in the in-plane direction, the relative moving velocity of the target to be measured and the separation displacement of the target to be measured can be accurately measured.