The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 25, 2023
Filed:
Mar. 02, 2017
Kabushiki Kaisha Toshiba, Tokyo, JP;
Hiroshi Kubota, Tokyo, JP;
Nobu Matsumoto, Ebina Kanagawa, JP;
Tomonori Fukushima, Kawasaki Kanagawa, JP;
KABUSHIKI KAISHA TOSHIBA, Tokyo, JP;
Abstract
A method for determining photodetector elements used for measurement, from photodetector elements of a photodetector device, includes directing measurement light to an object, such that the measurement light reflected by the object is incident on the photodetector device, selecting a group of candidate photodetector elements that are consecutively arranged to each other from the plurality of photodetector elements, and obtaining an output signal from each of the candidate photodetector elements of the group when the reflected measurement light is incident on the photodetector device. The method further comprises repeatedly shifting the group of candidate photodetector elements to select a new group of candidate photodetector elements that are consecutively arranged, obtaining the output signal from each of the candidate photodetector elements of each newly-selected group, and determining the photodetector elements used for measurement, based on the output signals from the candidate photodetector elements of each selected group.