The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 25, 2023

Filed:

Oct. 07, 2020
Applicant:

Sintokogio, Ltd., Nagoya, JP;

Inventors:

Yuuka Ito, Toyokawa, JP;

Eiji Yamaguchi, Toyokawa, JP;

Nayuta Horie, Toyokawa, JP;

Mizuki Okubo, Toyokawa, JP;

Assignee:

SINTOKOGIO, LTD., Nagoya, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 29/44 (2006.01); G01N 29/06 (2006.01); G01N 29/26 (2006.01);
U.S. Cl.
CPC ...
G01N 29/4445 (2013.01); G01N 29/0654 (2013.01); G01N 29/26 (2013.01); G01N 2291/044 (2013.01); G01N 2291/26 (2013.01);
Abstract

An ultrasonic inspection apparatus includes: an acquisition unit acquiring a signal indicating a fundamental wave and a second harmonic of an ultrasonic wave, which are obtained by the ultrasonic wave being scanned over an inspection object through a medium, at each scanning position; a calculation unit calculating a value obtained by dividing a second harmonic amplitude by a square of a fundamental wave amplitude, at each scanning position; and an output unit outputting information on a defect of the inspection object, based on the value obtained by dividing the second harmonic amplitude by the square of the fundamental wave amplitude.


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