The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 25, 2023

Filed:

Feb. 10, 2020
Applicant:

Mitsubishi Electric Research Laboratories, Inc., Cambridge, MA (US);

Inventors:

Yanting Ma, Allston, MA (US);

Muhammad Asad Lodhi, Edison, NJ (US);

Hassan Mansour, Boston, MA (US);

Petros Boufounos, Winchester, MA (US);

Dehong Liu, Lexington, MA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/20 (2018.01); G01M 5/00 (2006.01); G01N 22/00 (2006.01); G01S 13/88 (2006.01); G01S 13/89 (2006.01); G01V 8/00 (2006.01); G01V 9/00 (2006.01); G01S 13/00 (2006.01);
U.S. Cl.
CPC ...
G01N 23/20 (2013.01); G01M 5/0025 (2013.01); G01N 22/00 (2013.01); G01S 13/887 (2013.01); G01S 13/89 (2013.01); G01V 8/00 (2013.01); G01V 9/00 (2013.01); G01N 2223/101 (2013.01); G01N 2223/405 (2013.01);
Abstract

A permittivity sensor, for determining an image of a distribution of permittivity of a material of an object in a scene, comprising an input interface, a hardware processor, and an output interface is provided. The input interface is configured to accept phaseless measurements of propagation of a known incident field through the scene and scattered by the material of the object in the scene. The hardware processor is configured to solve a multi-variable minimization problem over unknown phases of the phaseless measurements and unknown image of the permittivity of the material of the object by minimizing a difference of a nonlinear function of the known incident field and the unknown image with a product of known magnitudes of the phaseless measurements and the unknown phases. Further, the output interface is configured to render the permittivity of the material of the object provided by the solution of the multi-variable minimization problem.


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