The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 25, 2023
Filed:
Sep. 21, 2020
Applicant:
Ssab Enterprises, Llc, Lisle, IL (US);
Inventors:
Sunday O. Abraham, Bettendorf, IA (US);
Yufeng Wang, Bettendorf, IA (US);
Justin P. Raines, Davenport, IA (US);
Richard L. Bodnar, Bettendorf, IA (US);
Jason E. Thomas, Daphne, AL (US);
Steven S. Hansen, Batavia, IL (US);
Assignee:
SSAB Enterprises, LLC, Lisle, IL (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2022.01); G01N 21/88 (2006.01); G01N 21/89 (2006.01); G01N 21/95 (2006.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
G01N 21/8851 (2013.01); G01N 21/8914 (2013.01); G01N 21/95 (2013.01); G06T 7/0004 (2013.01); G01N 2021/8887 (2013.01); G06T 2207/30116 (2013.01); G06T 2207/30164 (2013.01);
Abstract
A method for quantitatively measuring internal defects in an as-cast steel product includes optically scanning at least a portion of a surface of the steel product with a scanning device to create a digital image thereof, analyzing the digital image to calculate a quantitative value for an amount of internal defects therein, and normalizing the quantitative value to a rating according to a standardized scale.