The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 25, 2023
Filed:
Jul. 26, 2021
Applicant:
Abbott Japan Llc, Tokyo, JP;
Inventor:
Tomohiro Ikeda, Matsudo, JP;
Assignee:
ABBOTT JAPAN CO., LTD, Chiba Prefecture, JP;
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/64 (2006.01); G01N 33/543 (2006.01); G01N 21/51 (2006.01); G01N 21/75 (2006.01);
U.S. Cl.
CPC ...
G01N 21/75 (2013.01); G01N 21/51 (2013.01); G01N 21/64 (2013.01); G01N 21/645 (2013.01); G01N 21/6428 (2013.01); G01N 21/6452 (2013.01); G01N 33/54366 (2013.01); G01N 2201/063 (2013.01); G01N 2201/0621 (2013.01);
Abstract
A compact optical imaging system including a single filter and a light source that provides lateral illumination for bead detection in digital assays. The light source is configured to emit light toward the detection vessel. The single filter is positioned to receive light reflected from a sample in the detection vessel, that originated from the light source, and receive an output from a sample in the detection vessel. A detector is configured to receive a portion of the reflected light and a portion of the output that passes through the single filter.