The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 25, 2023
Filed:
Jun. 01, 2018
Universite DE Lille, Lille, FR;
Centre National DE LA Recherche Scientifique, Paris, FR;
Institut National DE LA Recherche Agronomique, Paris, FR;
Institut National Des Sciences Appliquees DE Toulouse, Toulouse, FR;
Vincent Senez, Baisieux, FR;
Alexis Vlandas, Villeneuve d'Ascq, FR;
Sebastien Lamant, Lille, FR;
Bernard Cathala, La Chapell-sur-Erdre, FR;
Celine Moreau, Nantes, FR;
Gabrielle Veronese, Lautignac, FR;
Sophie Bozonnet, Toulouse, FR;
Elisabeth Laville, Toulouse, FR;
Megane Cleret, Toulouse, FR;
Universite De Lille, Lille, FR;
Centre National De La Recherche Scientifique, Paris, FR;
Institut National De La Recherche Agronomique, Paris, FR;
Institute National Des Sciences Appliquees De Toulouse, Toulouse, FR;
Abstract
A process for detecting the sensitivity of one or more polymers and/or of one or more mixtures of polymers to a compound, including the steps of exposing a plurality of individualized micro-deposits including the polymer(s) and/or the mixture(s) of polymers to the compound, and detecting, by interferometry, a variation in appearance of an assembly of micro-deposits exposed to the compound and/or a variation in the dimensions and/or refractive index of at least one of the micro-deposits exposed to the compound, linked to an interaction between the polymer(s) and/or the mixture(s) of polymers and the compound.