The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 25, 2023
Filed:
Feb. 17, 2020
Jilin University, Jilin, CN;
Hongwei Zhao, Jilin, CN;
Jiucheng Zhao, Jilin, CN;
Shizhong Zhang, Jilin, CN;
Lixia Xu, Jilin, CN;
Jie Wan, Jilin, CN;
Xu Jing, Jilin, CN;
Daqing Zhao, Jilin, CN;
Zhenzhang Zhao, Jilin, CN;
Liming Zhou, Jilin, CN;
Yuming Fang, Jilin, CN;
Yu An Mou, Jilin, CN;
JILIN UNIVERSITY, Jilin, CN;
Abstract
An instrument and method for mechanical properties in situ testing of materials under a high temperature and complex mechanical loads are provided. The instrument includes: a support frame module used to provide a stable support and an effective vibration isolation for each functional module of the instrument; a high-frequency fatigue load applying module used to apply a high-frequency fatigue load on a tested sample; a static-dynamic mechanical load applying module used to apply a combination of static-dynamic tension/compression/bending loads on the tested sample; a high/low temperature applying module used to apply a variable temperature environment from a low temperature to a high temperature on the tested sample; and an in-situ monitoring module that may integrate a surface deformation damage measurement assembly, a three-dimensional strain measurement assembly, a microstructure measurement assembly, and an internal damage detection assembly according to a practical testing requirement.