The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 25, 2023
Filed:
Mar. 29, 2018
Agency for Science, Technology and Research, Singapore, SG;
Malini Olivo, Singapore, SG;
Gurpreet Singh, Singapore, SG;
Renzhe Bi, Singapore, SG;
Kapil Dev, Singapore, SG;
Dinish Unnimadhava Kurup Soudamini Amma, Singapore, SG;
Chris Jun Hui Ho, Singapore, SG;
Agency for Science, Technology and Research, Singapore, SG;
Abstract
Provided is an optical probe, and a Raman spectroscopy system using such, including excitation and detection optics coupled to a sampling optics via a beam splitter, in confocal arrangement with a sample focal plane of the sampling optics. The detection optics is arranged to receive Raman signal from the sample focal plane and direct it onto a tip of a detection optical fiber. The optical probe may further include a positioning device mechanically coupled to the sampling optics and configured to control a position of the sample focal plane. In the Raman spectroscopy system a light source is coupled to the excitation optics via an excitation optical fiber, and a spectrometer is coupled to a detection optics via a detection optical fiber. Provided is further a method for measuring Raman signal depth profile in a sample, wherein sample's Raman spectra is measured and stored at different focal plane positions.