The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 25, 2023
Filed:
Dec. 20, 2019
Carl Zeiss Industrielle Messtechnik Gmbh, Oberkochen, DE;
Michael Totzeck, Schwaebisch Gmuend, DE;
Danny Krautz, Berlin, DE;
Diana Spengler, Aalen, DE;
Uwe Wolf, Magdala, DE;
Christoph-Hilmar Graf Vom Hagen, Oakland, CA (US);
Christian Holzner, Wettringen, DE;
Lars Omlor, Pleasanton, CA (US);
Carl Zeiss Industrielle Messtechnik GmbH, Oberkochen, DE;
Abstract
Methods and devices for additive manufacturing of workpieces are provided. For analysis during production, a test is carried out using a selected test method. The test results are compared with simulated test results derived during a simulation of the manufacturing and testing. The test may use one or more of a laser ultrasound test unit, an electronic laser speckle interferometry test unit, an infrared thermography test unit, or an x-ray test unit.