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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 11633790 B1

PDFFull Text
Date of Patent:
Apr. 25, 2023

Filed:

Nov. 18, 2020

Method for rapid development of additive manufacturing parameter set

Applicant:

Carl Zeiss Industrial Metrology, Llc, North Maple Grove, MN (US);

Inventors:

Pradeep Bhattad, Knoxville, TN (US);

Paul Brackman, Knoxville, TN (US);

Curtis Frederick, Knoxville, TN (US);

Marcin B. Bauza, Plymouth, MN (US);

Edson Costa Santos, Oberkochen, DE;

Ryan Dehoff, Knoxville, TN (US);

Alex Plotkowski, Knoxville, TN (US);

Aleksandr Lisovich, Plymouth, MN (US);

Jason James Tenboer, Elk River, MN (US);

Assignees:

Carl Zeiss Industrial Metrology, LLC, North Maple Grove, MN (US);

UT-Battelle, LLC, Oak Ridge, TN (US);

Attorney:

Miller Johnson

Primary Examiner:

Colin W Slifka

Int. Cl.
CPC ...
B22F 10/85 (2021.01); B33Y 10/00 (2015.01); B33Y 30/00 (2015.01); B33Y 50/02 (2015.01); G06T 7/33 (2017.01); B22F 12/90 (2021.01); B22F 10/28 (2021.01); G06V 30/18 (2022.01); G06V 10/44 (2022.01); G06T 7/00 (2017.01); G06T 11/00 (2006.01);
U.S. Cl.
CPC ...
B22F 10/85 (2021.01); B22F 10/28 (2021.01); B22F 12/90 (2021.01); B33Y 10/00 (2014.12); B33Y 30/00 (2014.12); B33Y 50/02 (2014.12); G06T 7/0006 (2013.01); G06T 7/337 (2017.01); G06T 11/005 (2013.01); G06V 10/44 (2022.01); G06V 30/18019 (2022.01); G06T 2207/30144 (2013.01);
Abstract

An apparatus includes a control system that defines a test part having multiple features of multiple feature types. The control system controls an additive manufacturing (AM) machine to print multiple copies of the test part, with each copy being printed according to a respective set of values used as printing parameters. A measurement system obtains a computed tomography (CT) image of each of the copies of the test part. An analysis system, for each of the plurality of feature types, analyzes the CT images to identify a selected set of values for the printing parameters. The analysis system identifies a portion of the CT image related to a first feature and assesses its density based on an average grayscale value. The AM machine is then controlled to print production parts according to, for each feature type of the production parts, the selected set of values for the printing parameters.

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