The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 18, 2023

Filed:

Dec. 26, 2018
Applicant:

Mitsui Mining & Smelting Co., Ltd., Tokyo, JP;

Inventors:

Yuki Nakayama, Ageo, JP;

Tsukasa Takahashi, Ageo, JP;

Takahiro Ito, Ageo, JP;

Norihiko Miyashita, Ageo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01M 10/00 (2006.01); H01M 10/0562 (2010.01); H01M 4/38 (2006.01); H01M 4/583 (2010.01); H01M 10/052 (2010.01);
U.S. Cl.
CPC ...
H01M 10/0562 (2013.01); H01M 4/382 (2013.01); H01M 4/386 (2013.01); H01M 4/583 (2013.01); H01M 10/052 (2013.01); H01M 2300/008 (2013.01);
Abstract

Provided is a sulfide-based solid electrolyte comprising lithium, phosphorus, sulfur, and a halogen, as a novel solid electrolyte capable of suppressing generation of hydrogen sulfide and securing ionic conductivity. The solid electrolyte is characterized by comprising LiPSHa(wherein Ha represents a halogen, and 'a' satisfies 0.2<a≤1.8) having an argyrodite-type crystal structure, and LiPS, wherein, in an X-ray diffraction (XRD) pattern obtained through measurement by an X-ray diffraction method, the ratio of the peak intensity of a peak appearing at a position in a range of diffraction angle 2θ=26.0° to 28.8° derived from LiPS, relative to the peak intensity of a peak appearing at a position in a range of diffraction angle 2θ=24.9° to 26.3° derived from the argyrodite-type crystal structure, is 0.04 to 0.3.


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