The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 18, 2023

Filed:

Sep. 18, 2020
Applicant:

Spirit Aerosystems, Inc., Wichita, KS (US);

Inventors:

Mark Davis Haynes, Andover, KS (US);

Glen Paul Cork, Wichita, KS (US);

Bharath Achyutha Rao, Wichita, KS (US);

John Thomas Baumfalk-Lee, Wichita, KS (US);

Matthew W. McKenna, Wichita, KS (US);

Bruce E. Gabel, Wichita, KS (US);

Scott Bishop, Wichita, KS (US);

Gregorio Balandran, Wichita, KS (US);

Assignee:

SPIRIT AEROSYSTEMS, INC., Wichita, KS (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/246 (2017.01); G01N 21/88 (2006.01); B64F 5/40 (2017.01); B64F 5/60 (2017.01);
U.S. Cl.
CPC ...
G06T 7/246 (2017.01); G01N 21/88 (2013.01); B64F 5/40 (2017.01); B64F 5/60 (2017.01); G06T 2207/10032 (2013.01);
Abstract

A system for inspecting features of an airframe, the system including a feature inspection device configured to measure an aspect of a first feature and a tracking subsystem configured to determine a position of the feature inspection device when the feature inspection device measures the aspect of the first feature. The system is configured to determine a position of the first feature on the airframe via the feature inspection device and the tracking subsystem, the determination of the position of the first feature being independent from the measurement of the aspect of the first feature.


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