The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 18, 2023

Filed:

Aug. 20, 2020
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Dongwoo Kang, Seoul, KR;

Dong Kyung Nam, Yongin-si, KR;

Jingu Heo, Yongin-si, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/11 (2017.01); G06V 10/141 (2022.01); G06V 40/18 (2022.01); G06F 3/01 (2006.01); G06T 5/50 (2006.01); G06V 10/143 (2022.01); G06V 10/62 (2022.01); G06V 20/59 (2022.01);
U.S. Cl.
CPC ...
G06T 7/11 (2017.01); G06F 3/013 (2013.01); G06T 5/50 (2013.01); G06V 10/141 (2022.01); G06V 10/143 (2022.01); G06V 40/193 (2022.01); G06T 2207/10048 (2013.01); G06V 10/62 (2022.01); G06V 20/59 (2022.01);
Abstract

A method and apparatus for detecting a reflection are provided. The method includes acquiring an input image of an object, based on an activation of an infrared light source, acquiring a reference image of the object, based on a deactivation of the infrared light source, and extracting a reflection region from the input image, based on the input image and the reference image.


Find Patent Forward Citations

Loading…