The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 18, 2023

Filed:

Sep. 03, 2019
Applicant:

Kyoto University, Kyoto, JP;

Inventors:

Megumi Nakao, Kyoto, JP;

Toyofumi Yoshikawa, Kyoto, JP;

Junko Tokuno, Kyoto, JP;

Hiroshi Date, Kyoto, JP;

Tetsuya Matsuda, Kyoto, JP;

Assignee:

KYOTO UNIVERSITY, Kyoto, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 15/00 (2011.01); G06T 7/00 (2017.01); A61B 34/10 (2016.01); G06T 7/50 (2017.01); G06T 7/73 (2017.01); G06T 7/246 (2017.01); G16H 30/20 (2018.01); G06N 3/08 (2023.01); G06T 17/20 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0016 (2013.01); A61B 34/10 (2016.02); G06N 3/08 (2013.01); G06T 7/251 (2017.01); G06T 7/50 (2017.01); G06T 7/75 (2017.01); G06T 17/20 (2013.01); G16H 30/20 (2018.01); A61B 2034/105 (2016.02); G06T 2207/20081 (2013.01); G06T 2207/30061 (2013.01);
Abstract

A machine learning device includes: a generation unit generating a first shape model representing a shape of an object before deformation and a second shape model representing a shape of the object after the deformation based on measurement data before and after the deformation; and a learning unit learning a feature amount including a difference value between each micro region and another micro region that constitute the first shape model, and a relation providing a displacement from the each micro region of the first shape model to each corresponding micro region of the second shape model.


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