The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 18, 2023

Filed:

Jan. 26, 2021
Applicant:

Kyndryl, Inc., New York, NY (US);

Inventors:

Hareesh Andoor Veettil, Bengaluru, IN;

Kumar Saurabh, Bengaluru, IN;

Assignee:

Kyndryl, Inc., New York, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 7/00 (2006.01); G06F 17/00 (2019.01); G06F 16/27 (2019.01); G06F 9/50 (2006.01); G06F 11/30 (2006.01); G06F 16/23 (2019.01);
U.S. Cl.
CPC ...
G06F 16/275 (2019.01); G06F 9/505 (2013.01); G06F 11/3034 (2013.01); G06F 16/2308 (2019.01);
Abstract

Data migration based on data change rate analysis is provided. A minimum data replication duration is calculated for each respective data migration event of a set of data migration events in an existing data migration wave plan by adjusting a planned data replication duration until a data change rate per day of servers is equal to an estimated server data replication rate per day when the existing data migration wave plan is not feasible. A new data replication start date, a new data replication end date, and a new data migration cutover date is determined for each respective data migration event based on the minimum data replication duration for each respective data migration event. A new data migration wave plan is generated based on the new data replication start date, the new data replication end date, and the new data migration cutover date for each respective data migration event.


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