The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 18, 2023
Filed:
Feb. 06, 2019
Siemens Aktiengesellschaft, Munich, DE;
Christof Budnik, Hamilton, NJ (US);
Georgi Markov, Plainsboro, NJ (US);
Marco Gario, Plainsboro, NJ (US);
Zhu Wang, Princeton, NJ (US);
SIEMENS AKTIENGESELLSCHAFT, Munich, DE;
Abstract
A method for testing software applications in a system under test (SUT) includes building a reference model of the SUT that defines a computer-based neural network. The method includes training the reference model using input data and corresponding output data generated by the SUT, selecting an output value within a domain of possible output values of the SUT representing an output that is not represented in the output data used to train the reference model, applying the selected output value to the reference model, and tracing the selected output through the reference model to identify test input values that when input to the reference model, produce the selected output value. The method can further include using the identified test input values to test the system under test.