The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 18, 2023

Filed:

Oct. 03, 2018
Applicant:

Mitsubishi Electric Corporation, Tokyo, JP;

Inventors:

Taishi Azuma, Tokyo, JP;

Toshihiro Kobayashi, Tokyo, JP;

Yuki Hikawa, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2018.01); G06F 8/75 (2018.01); G06F 8/41 (2018.01); G06F 8/74 (2018.01);
U.S. Cl.
CPC ...
G06F 8/75 (2013.01); G06F 8/433 (2013.01); G06F 8/74 (2013.01);
Abstract

A software analysis device being capable of analyzing dependency between software components more comprehensively and with higher accuracy than a conventional technology is provided. The software analysis device comprising: a first analyzing unit that statically analyzes a structure of a source code of software and analyzes dependency between objects of the software; and a second analyzing unit that executes a program indicated by the source code to acquire first information regarding an operation of the objects and analyzes dependency between the objects based on the first information. The software analysis device analyzes dependency between the objects based on an analysis result of the first analyzing unit and an analysis result of the second analyzing unit.


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