The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 18, 2023

Filed:

May. 29, 2019
Applicants:

Hsu-chang Hsu, Taoyuan, TW;

Kuo-yen Hsu, Taoyuan, TW;

Inventors:

Hsu-Chang Hsu, Taoyuan, TW;

Kuo-Yen Hsu, Taoyuan, TW;

Assignee:

CHROMA ATE INC., Taoyuan, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 1/067 (2006.01); G01R 31/364 (2019.01); G01R 31/388 (2019.01);
U.S. Cl.
CPC ...
G01R 1/067 (2013.01); G01R 31/364 (2019.01); G01R 31/388 (2019.01);
Abstract

The present invention is related to a clipped testing device, comprising a first clamping member, a second clamping member, a shaft, and a conducting member. The first clamping member has a first pin joint member and a first substrate, the second clamping member has a second pin joint member and a second substrate. The shaft detachably pivoted to a first pin joint member and a second pin joint member. The conducting member is disposed on the first clamping member and is located between the first substrate and the second substrate. The conducting member has an upper surface and a lower surface. The lower surface of the conducting member faces toward the first substrate, and at least a part of the conducting member is wavy-shaped and has a first scraping structure on the upper surface thereof.


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