The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 18, 2023

Filed:

Nov. 25, 2020
Applicant:

Hitachi-ge Nuclear Energy, Ltd., Hitachi, JP;

Inventors:

Sou Kitazawa, Tokyo, JP;

Yasuhiro Nidaira, Hitachi, JP;

Kazuya Ehara, Hitachi, JP;

Junichiro Naganuma, Hitachi, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 29/12 (2006.01); G01N 29/04 (2006.01); G01N 29/06 (2006.01);
U.S. Cl.
CPC ...
G01N 29/12 (2013.01); G01N 29/043 (2013.01); G01N 29/0609 (2013.01); G01N 2291/044 (2013.01);
Abstract

An ultrasonic inspection method in which a pulse signal is output to an ultrasonic sensor to generate and transmit ultrasonic waves, the ultrasonic waves reflected or scattered by an object are received and converted into a waveform signal by the ultrasonic sensor, and the waveform signal is digitized to acquire waveform data, includes: executing modulation processing for modulating a plurality of waveform data acquired in multiple inspections and under the same inspection conditions by a phase modulation method to generate composite waveform data; and executing demodulation processing for demodulating the composite waveform data to generate compressed waveform data.


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