The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 18, 2023

Filed:

Jun. 22, 2018
Applicant:

Otsuka Pharmaceutical Co., Ltd., Tokyo, JP;

Inventors:

Tetsuya Noda, Hino, JP;

Masanao Majima, Hino, JP;

Yuuya Shouji, Hachioji, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/94 (2006.01); G01N 21/552 (2014.01); G01N 21/64 (2006.01); G01N 21/958 (2006.01);
U.S. Cl.
CPC ...
G01N 21/94 (2013.01); G01N 21/553 (2013.01); G01N 21/6428 (2013.01); G01N 21/958 (2013.01); G01N 2021/6439 (2013.01);
Abstract

An analysis method for detecting an amount of a substance by irradiating an analysis chip containing the substance and detecting a quantity of light output from the analysis chip. The analysis method including irradiating an incident surface of the analysis chip and another surface adjacent to the incident surface with detection light while changing a relative position of the detection light with respect to the analysis chip, detecting reflected light from the incident surface of the analysis chip, and acquiring information on a position of the analysis chip from a relationship between a quantity of the reflected light detected and the relative position. The analysis method determines if the analysis chip is abnormal when a quantity of target reflected light is equal to or lower than a predetermined light quantity.


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