The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 18, 2023
Filed:
Nov. 22, 2018
Hamamatsu Photonics K.k., Hamamatsu, JP;
National University Corporation Hamamatsu University School of Medicine, Hamamatsu, JP;
Toyohiko Yamauchi, Hamamatsu, JP;
Kentaro Goto, Hamamatsu, JP;
Hisayuki Matsui, Hamamatsu, JP;
Satoshi Hirakawa, Hamamatsu, JP;
Hidenao Yamada, Hamamatsu, JP;
HAMAMATSU PHOTONICS K.K., Hamamatsu, JP;
NATIONAL UNIVERSITY CORPORATION HAMAMATSU UNIVERSITY SCHOOL OF MEDICINE, Hamamatsu, JP;
Abstract
An interference image acquisition apparatus includes a light source, a beam splitter, a second reflection mirror, an imager, and a first reflection mirror. A cell is placed on one side of a transparent material, and the first reflection mirror is placed on the other side of the transparent material. In a two-beam interferometer, an optical path difference between an optical path length of a first light beam reflected by the first reflection mirror and an optical path length of a second light beam reflected by the second reflection mirror is set to a coherence length of light output from the light source or less. The imager acquires an interference image in a state in which the cell is placed at a position conjugate to an imaging plane in a first optical system between the imaging plane and the first reflection mirror.