The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 18, 2023

Filed:

Apr. 11, 2022
Applicant:

X Development Llc, Mountain View, CA (US);

Inventors:

Gearoid Murphy, Mountain View, CA (US);

Artem Goncharuk, Mountain View, CA (US);

Lance Co Ting Keh, La Crescenta, CA (US);

Diosdado Rey Banatao, Los Altos Hills, CA (US);

Sujit Sanjeev, Mountain View, CA (US);

Assignee:

X Development LLC, Mountain View, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/31 (2006.01); G16C 20/20 (2019.01); G01J 3/28 (2006.01); G01N 33/52 (2006.01);
U.S. Cl.
CPC ...
G01N 21/314 (2013.01); G01J 3/28 (2013.01); G16C 20/20 (2019.02); G01N 33/52 (2013.01); G01N 2021/3155 (2013.01);
Abstract

The present disclosure relates to techniques for deformulating the spectra of arbitrary compound formulations such as polymer formulations into their chemical components. Particularly, aspects of the present disclosure are directed to obtaining an initial set of spectra for a plurality of samples comprising pure samples and composite samples, constructing a basis set of spectra for a plurality of pure samples based on the initial set of spectra, and providing or outputting the basis set of spectrum. The basis set of spectra is constructed in an iterative process that attempts to decompose, using a decomposition algorithm or model, the spectrum from the initial set of spectra in order to differentiate the pure samples from the composite samples. The basis set of spectra may then be used to deduce the composition of a material from a spectrogram.


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