The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 18, 2023

Filed:

Mar. 13, 2019
Applicant:

Panasonic Intellectual Property Management Co., Ltd., Osaka, JP;

Inventor:

Ryota Fujii, Fukuoka, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01H 9/00 (2006.01); G01H 3/00 (2006.01); G01H 11/06 (2006.01);
U.S. Cl.
CPC ...
G01H 9/002 (2013.01); G01H 3/005 (2013.01); G01H 11/06 (2013.01);
Abstract

A measurement terminal includes: a storage that stores, for each of one or more inspection objects, setting information including a parameter related to a feature of an inspection and an abnormality; a processor; and a memory having instructions that, when executed by the processor, cause the processor to perform operations. The operations include: acquiring audio data of sound from an inspection object; deriving, based on the setting information of a corresponding one of the one or more inspection objects, a required time for acquiring the audio data of sound from the inspection object to be used for determining a presence or absence of the abnormality in the inspection object; and determining the presence or absence of the abnormality in the inspection object based on the audio data of sound from the inspection object for the derived required time.


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Fujii, Ryota. (2023). Measurement terminal, measurement system, measurement method, and program (U.S. Patent No. 11629993). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11629993

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