The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 18, 2023
Filed:
Jun. 30, 2020
Topcon Corporation, Tokyo, JP;
You Sasaki, Tokyo, JP;
Topcon Corporation, Tokyo, JP;
Abstract
A surveying apparatus has a combined structure of a total station and a laser scanner. The surveying apparatus includes a point cloud data acquiring unit, an abnormal part detecting unit, an abnormal part position acquiring unit, and an automatic sighting controller. The point cloud data acquiring unit acquires first point cloud data and second point cloud data obtained by laser scanning that is performed on an object to be inspected at a time interval. The abnormal part detecting unit calculates a difference between the first and second point cloud data to detect a part of the object to be inspected, at which position information varies, as a detailed-inspection target part. The abnormal part position acquiring unit acquires a position of the detailed-inspection target part. The automatic sighting controller controls to make the total station sight the detailed-inspection target part, based on the position of the detailed-inspection target part.