The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 18, 2023

Filed:

Feb. 01, 2021
Applicant:

International Paper Company, Memphis, TN (US);

Inventor:

Kerry D. Figiel, Cincinnati, OH (US);

Assignee:

INTERNATIONAL PAPER COMPANY, Memphis, TN (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
D21G 9/00 (2006.01); D21F 3/06 (2006.01); G01L 5/00 (2006.01);
U.S. Cl.
CPC ...
D21F 3/06 (2013.01); D21G 9/0036 (2013.01); G01L 5/0085 (2013.01);
Abstract

Multiple groups of sensors are circumferentially spaced apart at each cross-directional position along a sensing roll of a nip press to measure and cancel or nearly cancel the effects of rotational variability which may be acting on the sensing roll. The strategically-placed sensors are designed to measure the pressure being placed against the web that is being advanced through the nip press. The average of the measurements of multiple sensors spaced circumferential apart provides a good cancellation of any rotational variability that might be found at a cross-directional position on the sensing roll. In this manner, a more true measurement of the nip pressure profile can be obtained and better adjustments made to reduce nip pressure profile variability. In addition, the nip variability profile may be used as a predictor of cover or bearing failures, resonant frequencies and other roll anomalies.


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