The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 18, 2023

Filed:

Jun. 08, 2020
Applicant:

Wistron Corporation, New Taipei, TW;

Inventors:

Min-Yen Li, New Taipei, TW;

Tsung-Yin Tsou, New Taipei, TW;

Hsiang-Min Chan, New Taipei, TW;

Ke-Yu Lan, New Taipei, TW;

Assignee:

Wistron Corporation, New Taipei, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B25J 9/00 (2006.01); B25J 9/16 (2006.01); B25J 9/14 (2006.01); B25J 13/08 (2006.01);
U.S. Cl.
CPC ...
B25J 9/0006 (2013.01); B25J 9/14 (2013.01); B25J 9/161 (2013.01); B25J 9/1633 (2013.01); B25J 9/1674 (2013.01); B25J 13/088 (2013.01);
Abstract

A force applying auxiliary device and a control method thereof are provided. The force applying auxiliary device includes a sensor group, a processor, and a force applying driver. The sensor group includes a first sensor disposed on a first side and a second sensor disposed on a second side. The processor collects motion posture data of a user according to the first sensor and the second sensor, and determines whether a motion of the user is abnormal. When determining that the motion of the user is abnormal, the processor selects at least one preset abnormal pattern as a specific abnormal pattern according to the motion posture data, and controls the force applying driver to provide a force by using the specific abnormal pattern. A force difference between first and second forces applied to first and second side feet is adjusted based on a difference in sampling values between the sensors.


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