The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 18, 2023

Filed:

Aug. 28, 2020
Applicant:

Agathon Ag, Maschinenfabrik, Bellach, CH;

Inventors:

Stephan Scholze, Birmensdorf, CH;

Dejan Seatovic, Winterthur, CH;

Markus Allenspach, Lohn-Ammannsegg, CH;

Stefan Nobs, Aarberg, CH;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B23Q 17/22 (2006.01); B23Q 17/00 (2006.01); B23Q 17/24 (2006.01);
U.S. Cl.
CPC ...
B23Q 17/2216 (2013.01); B23Q 17/005 (2013.01); B23Q 17/2457 (2013.01); B23Q 17/2476 (2013.01);
Abstract

System for measuring misalignment of a tool () in a press device (), the tool () comprises at least a first part () and a second part (), which are movable relative to another in a guided manner by means of guide means comprising at least a guide pillar () provided in the first part () which is led in a guide bush () provided in the second part (), wherein the system comprises measuring means () provided to detect misalignment of the tool (). According to the invention, the measuring means () are mounted directly at the guide means.


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