The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 18, 2023

Filed:

Apr. 29, 2020
Applicant:

Koninklijke Philips N.v., Eindhoven, NL;

Inventor:
Assignee:

KONINKLIJKE PHILIPS N.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B06B 1/02 (2006.01); A61B 8/00 (2006.01); G01S 7/52 (2006.01); G01S 15/89 (2006.01);
U.S. Cl.
CPC ...
B06B 1/0292 (2013.01); A61B 8/4494 (2013.01); B06B 1/0207 (2013.01); G01S 7/52046 (2013.01); G01S 7/52079 (2013.01); G01S 15/8925 (2013.01); G01S 15/8993 (2013.01); B06B 2201/51 (2013.01);
Abstract

An ultrasound system has a set of CMUT ultrasound transducer devices and a drive circuit for operating the ultrasound transducer devices, for delivering an AC drive signal and receiving a reflected signal. An intermediate circuit is between the drive circuit and the set of ultrasound devices in the form of an array of coupling circuits, each coupling circuit between the drive circuit and an associated at least one ultrasound transducer device. Each coupling circuit comprises a buffer element connected between a bias voltage and a device terminal and as series capacitor. The intermediate circuit serves as a connection link between the set of CMUT transducer elements and the driving/sensing electronics, and is formed as a passive integrated technology circuit. The buffer element prevents a low-impedance short between the CMUT cell bias node and the counter electrode in the case of a CMUT cell drum short circuit. In this way, failure of an individual cell will not cause a breakdown of the whole CMUT array nor a breakdown of the driving electronics.


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