The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 11, 2023

Filed:

Sep. 09, 2019
Applicant:

Kabushiki Kaisha Toshiba, Minato-ku, JP;

Inventors:

Yasuhiro Kanishima, Suginami, JP;

Takashi Sudo, Fuchu, JP;

Hiroyuki Yanagihashi, Kawasaki, JP;

Assignee:

Kabushiki Kaisha Toshiba, Minato-ku, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G07C 3/00 (2006.01); G06T 7/00 (2017.01); G06F 30/20 (2020.01);
U.S. Cl.
CPC ...
G07C 3/00 (2013.01); G06F 30/20 (2020.01); G06T 7/0004 (2013.01); G06T 2207/30164 (2013.01);
Abstract

According to one embodiment, a monitoring system includes a processor. The processor accepts first data output from a first detector. The first detector detects a signal caused by equipment. The processor performs a first determination when a first value is in a first state. The first value indicates a state of the first detector or an environment where the equipment is provided. The first determination determines a condition of the equipment by using a first model and the first data. The processor performs a second determination when the first value is in a second state different from the first state. The second determination determines the condition of the equipment by using a second model and the first data. The second model is different from the first model.


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