The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 11, 2023

Filed:

Aug. 25, 2021
Applicant:

Meta Platforms Technologies, Llc, Menlo Park, CA (US);

Inventor:

Michael Hall, Bellevue, WA (US);

Assignee:

META PLATFORMS TECHNOLOGIES, LLC, Menlo Park, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/521 (2017.01); G06T 19/00 (2011.01);
U.S. Cl.
CPC ...
G06T 7/521 (2017.01); G06T 19/006 (2013.01); G06T 2207/10152 (2013.01);
Abstract

A depth measurement assembly (DMA) includes an illumination source that projects pulses of light (e.g., structured light) at a temporal pulsing frequency into a local area. The DMA includes a sensor that capture images of the pulses of light reflected from the local area and determines, using one or more of the captured images, one or more TOF phase shifts for the pulses of light. The DMA includes a controller coupled to the sensor and configured to determine a first set of estimated radial distances to an object in the local area based on the one or more TOF phase shifts. The controller determines a second estimated radial distance to the object based on an encoding of structured light and at least one of the captured images. The controller selects an estimated radial distance from the first set of radial distances.


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