The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 11, 2023

Filed:

Oct. 14, 2020
Applicant:

Baker Hughes Oilfield Operations Llc, Houston, TX (US);

Inventor:

Kevin Andrew Coombs, Syracuse, NY (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 13/04 (2006.01); G06T 7/00 (2017.01); G05B 19/406 (2006.01); G06Q 10/0639 (2023.01); G06Q 10/10 (2023.01); G06N 20/00 (2019.01); G06Q 10/0631 (2023.01);
U.S. Cl.
CPC ...
G06T 7/0004 (2013.01); G05B 13/04 (2013.01); G05B 13/044 (2013.01); G05B 19/406 (2013.01); G06N 20/00 (2019.01); G06Q 10/06395 (2013.01); G06Q 10/10 (2013.01); G05B 2219/31304 (2013.01); G06Q 10/06316 (2013.01); G06T 2207/20081 (2013.01);
Abstract

An inspection-plan based inspection method includes receiving data characterizing an inspection plan associated with inspection of one or more nodes in an inspection site by an inspection device. A first step of the inspection plan includes a first set of operating parameters of the inspection device associated with the inspection of a first node of the one or more nodes and a first set of constraints associated with one or more inspection criteria at the first node by the inspection device. The method also includes generating a first control signal configured to instruct the inspection device to inspect the first node of the one or more nodes. The first control signal is based on one or more of the first set of operating parameters and a user input. The method further includes receiving data characterizing the inspection measurement of the first node by the inspection device.


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