The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 11, 2023

Filed:

Mar. 29, 2021
Applicant:

Applied Materials, Inc., Santa Clara, CA (US);

Inventors:

Abhinav Kumar, San Jose, CA (US);

Benjamin Schwarz, San Jose, CA (US);

Charles Hardy, San Jose, CA (US);

Assignee:

Applied Materials, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 3/40 (2006.01); G06N 3/08 (2023.01); G06N 20/00 (2019.01); G06K 9/00 (2022.01); G06T 7/62 (2017.01); G06T 5/50 (2006.01);
U.S. Cl.
CPC ...
G06T 3/4046 (2013.01); G06K 9/00523 (2013.01); G06N 3/08 (2013.01); G06N 20/00 (2019.01); G06T 5/50 (2013.01); G06T 7/62 (2017.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01);
Abstract

A method includes determining a plurality of features of a first original image of a first product that are expected to be different for one or more products to be produced via manufacturing parameters of a manufacturing process compared to the first product. The method further includes adjusting one or more of the plurality of features of the first original image to generate a first synthetic image. The method further includes providing a plurality of images including the first original image and the first synthetic image to train a machine learning model to generate a trained machine learning model configured to generate output associated with updating the manufacturing parameters of the manufacturing process.


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