The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 11, 2023

Filed:

Mar. 23, 2020
Applicant:

Dell Products L.p., Round Rock, TX (US);

Inventor:

Benjamin Fauber, Austin, TX (US);

Assignee:

Dell Products L.P., Round Rock, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/906 (2019.01); G06Q 50/26 (2012.01); G06F 16/903 (2019.01); G06F 21/62 (2013.01); G06F 16/901 (2019.01); G06Q 30/02 (2012.01);
U.S. Cl.
CPC ...
G06F 16/906 (2019.01); G06F 16/9024 (2019.01); G06F 16/90344 (2019.01); G06F 21/6218 (2013.01); G06Q 50/265 (2013.01); G06Q 30/0205 (2013.01);
Abstract

An apparatus includes a processing device configured to obtain first and second sets of data records, each data record comprising a string associated with an attribute. The processing device is also configured to generate a similarity matrix, wherein entries of the similarity matrix comprise values characterizing similarity between respective pairs of the strings comprising a first string from a data record in the first set and a second string from a data record in the second set. The processing device is further configured to construct a graph network based on the similarity matrix comprising edges connecting pairs of the data records based on values of entries in the similarity matrix, perform a clustering operation on the graph network to identify clusters, and to initiate remedial action responsive to identifying a given cluster comprising at least one data record from each of the first and second sets of data records.


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