The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 11, 2023

Filed:

Jun. 18, 2021
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Jae Hwan Lim, Seongnam-si, KR;

Seung-Woo Lim, Hwaseong-si, KR;

Sung-Wook Kim, Suwon-si, KR;

So-Geum Kim, Hwaseong-si, KR;

Jae Eun Kim, Yongin-si, KR;

Dae Hun You, Seoul, KR;

Walter Jun, Seoul, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/06 (2006.01);
U.S. Cl.
CPC ...
G06F 3/0659 (2013.01); G06F 3/0604 (2013.01); G06F 3/0689 (2013.01);
Abstract

A redundant array of independent disks (RAID) storage device including; a memory device including first memory devices configured to store at least one of data chunks and corresponding parity (data chunks/parity) and a second memory device configured to serve as a spare memory region, and a RAID controller including a RAID internal memory configured to store a count table and configured to control performing of a rebuild operation in response to a command received from a host, wherein upon identification of a failed first memory device, the RAID controller accesses used regions of non-failed first memory devices based on the count table and rebuilds data of the failed first memory device using the second memory device.


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