The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 11, 2023

Filed:

Nov. 15, 2017
Applicant:

Hkc Corporation Limited, Shenzhen, CN;

Inventor:

Huailiang He, Shenzhen, CN;

Assignee:

HKC Corporation Limited, Shenzhen, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02F 1/1362 (2006.01); H01L 21/66 (2006.01); H01L 27/12 (2006.01); G02F 1/1368 (2006.01);
U.S. Cl.
CPC ...
G02F 1/136259 (2013.01); H01L 22/22 (2013.01); H01L 27/124 (2013.01); H01L 27/1259 (2013.01); G02F 1/1368 (2013.01); G02F 1/136263 (2021.01);
Abstract

The present disclosure illustrates a repair method for an active matrix substrate. The repair method includes steps: performing the broken-line inspection process to inspect whether the broken line exists on the first and second gate lines; if one first gate line is inspected to be broken, performing a source line repair-section forming process to cut off the cut portions of the second source lines disposed at two sides of a pixel electrode corresponding to a broken location of the first gate line, to form source line repair sections overlapping with the broken first gate line and the second gate line; performing a gate line repair-section forming process on the second gate line, adjacent to the broken first gate line, to cut off the cut portions of the second gate line to form a gate line repair section overlapping with the second source lines; and performing a connection process.


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