The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 11, 2023
Filed:
Oct. 13, 2020
Applicant:
Krones Ag, Neutraubling, DE;
Inventor:
Alexander Hewicker, Woerth an der Donau, DE;
Assignee:
KRONES AG, Neutraubling, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/88 (2006.01); G06T 7/00 (2017.01); H04N 5/225 (2006.01);
U.S. Cl.
CPC ...
G01N 21/8851 (2013.01); G06T 7/001 (2013.01); H04N 5/2256 (2013.01); G01N 2021/8887 (2013.01); G06T 2207/20224 (2013.01);
Abstract
Method for the optical inspection of containers, where the containers are transported with a conveyor as a container mass flow, where the containers are each captured with an optical inspection unit as first image data, and where the first image data is evaluated with an image processing unit for contamination and/or defects on the respective container, where the first image data of several containers is overlaid to form an overlay image, and where the overlay image is evaluated for the presence of points of contamination in a beam path of the optical inspection unit.