The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 11, 2023
Filed:
Nov. 15, 2022
Applicant:
ML Optic Corp, Redmond, WA (US);
Inventors:
Pengfei Wu, Bellevue, WA (US);
Wei Zhou, Sammamish, WA (US);
Assignee:
ML Optic Corp., Redmond, WA (US);
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/50 (2006.01); G01J 3/28 (2006.01); G01J 3/02 (2006.01); G01J 3/14 (2006.01);
U.S. Cl.
CPC ...
G01J 3/50 (2013.01); G01J 3/021 (2013.01); G01J 3/0218 (2013.01); G01J 3/14 (2013.01); G01J 3/2823 (2013.01);
Abstract
A colorimeter configured to receive central rays and marginal rays, the colorimeter including an image sensor configured for receiving the central rays to produce a first image; a spectrometer configured for receiving the marginal rays to produce a second image; and at least one optical device configured to reflect at least a portion of the marginal rays through a light path to the spectrometer, wherein the first image and the second image are aggregated to produce a total image that is more extensive than the first image.