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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 11622798 B1

PDFFull Text
Date of Patent:
Apr. 11, 2023

Filed:

Apr. 29, 2020

Device and method for normalizing implant strain readings to assess bone healing

Applicant:

Depuy Synthes Products, Inc., Raynham, MA (US);

Inventors:

Carl Deirmengian, West Chester, PA (US);

George Mikhail, West Chester, PA (US);

Glen Pierson, West Chester, PA (US);

Assignee:

DEPUY SYNTHES PRODUCTS, INC., Raynham, MA (US);

Attorney:

Fay Kaplun & Marcin, LLP

Primary Examiner:

Daniel L Cerioni

Int. Cl.
CPC ...
A61B 17/80 (2006.01); A61B 5/103 (2006.01); A61B 5/07 (2006.01); A61B 5/00 (2006.01); A61B 90/00 (2016.01); A61B 17/00 (2006.01);
U.S. Cl.
CPC ...
A61B 17/80 (2013.01); A61B 5/076 (2013.01); A61B 5/103 (2013.01); A61B 5/4504 (2013.01); A61B 2017/00221 (2013.01); A61B 2090/064 (2016.02); A61B 2562/0261 (2013.01);
Abstract

A device and method for treating a hone includes a bone plate including first and second portions joined to one another via a connecting portion, a rigidity of the connecting portion being less than rigidities of each of the first and second portions in combination with a first sensor mounted on the first portion measuring strain on the first portion and a second sensor mounted on the second portion measuring strain on the second portion.

Find Patent Forward Citations

Deirmengian, Carl. (2023). Device and method for normalizing implant strain readings to assess bone healing (U.S. Patent No. 11622798). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11622798

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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