The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 04, 2023
Filed:
Nov. 05, 2021
Infineon Technologies Ag, Neubiberg, DE;
Mihail Jefremow, Augsburg, DE;
Ralph Mueller-Eschenbach, Munich, DE;
Juergen Schaefer, Oberhaching, DE;
Arndt Voigtlaender, Ottobrunn, DE;
David Zipperstein, Munich, DE;
Infineon Technologies AG, Neubiberg, DE;
Abstract
A calibration circuit, including: a first analog-to-digital converter (ADC) configured to sample a nonlinear reference signal continuously at an equidistant sampling rate to generate a reference sampled signal; a trigger timer configured to generate trigger signals; a second ADC configured to sample a point of each of the nonlinear reference signal and repeated versions of the nonlinear reference signal in response to the respective trigger signals at equidistantly increasing delays, to generate a device-under-test (DUT) sampled voltage; and processing circuitry configured to estimate a differential nonlinearity (DNL) of the DUT sampled signal, estimate a DNL of the reference sampled signal, and compare the estimated DNL of the DUT sampled signal with the estimated DNL of the reference sampled signal, to generate a DNL performance indication signal of the second ADC.