The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 04, 2023

Filed:

Dec. 01, 2017
Applicant:

Mitsubishi Electric Corporation, Tokyo, JP;

Inventors:

Hideo Komo, Tokyo, JP;

Takaaki Shirasawa, Tokyo, JP;

Shintaro Araki, Tokyo, JP;

Nobuyoshi Kimoto, Fukuoka, JP;

Takeshi Omaru, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 23/40 (2006.01); H01L 21/48 (2006.01); H01L 23/473 (2006.01);
U.S. Cl.
CPC ...
H01L 23/4012 (2013.01); H01L 21/4882 (2013.01); H01L 23/473 (2013.01); H01L 2023/4031 (2013.01); H01L 2023/4068 (2013.01); H01L 2023/4081 (2013.01);
Abstract

An object of the present invention is to provide a semiconductor device in which the effect of dimensional tolerance can be reduced, and a method for manufacturing the same. The semiconductor device according to the present invention includes: a plurality of cooling plates each having a coolant passage inside; spacers disposed to stack the cooling plates with spaces; at least one semiconductor package disposed on at least one principal surface of at least one of the cooling plates; and a spring plate disposed between adjacent ones of the cooling plates, the spring plate biasing the at least one semiconductor package toward the cooling plates.


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