The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 04, 2023

Filed:

Oct. 14, 2020
Applicant:

The Government of the United States of America, As Represented BY the Secretary of the Navy, Arlington, VA (US);

Inventors:

Erik Tejero, Falls Church, VA (US);

George Gatling, Fairfax, VA (US);

William Amatucci, Fairfax, VA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/26 (2006.01); G01N 9/36 (2006.01); G01R 33/00 (2006.01);
U.S. Cl.
CPC ...
H01J 37/266 (2013.01); G01N 9/36 (2013.01); G01R 33/0094 (2013.01);
Abstract

A method for non-invasively imaging plasma parameters has been invented. Crossed dipole pairs are used to differentiate changes in the measured complex self- and mutual impedances due to plasma density and magnetic field. Measurements of the complex self-impedance and mutual impedance between pairs of antennas over a wide range of frequencies provide spatial information to create an image of the plasma density and magnetic field. The spectral information is acquired simultaneously using a Gaussian monopulse as the driver signal.


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